Thin-film transistors (TFTs) on flexible
substrates are
crucial
components for the development of wearable sensors and smart electronic
systems. Various strategies have been explored to enable these devices
to achieve high-frequency performance and meet the requirements of
data communication systems. Among the strategies investigated, scaling
the length of the TFT channel stands out as one of the most promising
strategies in terms of compatibility and feasibility. However, the
fabrication process of thin-film semiconductors on non-rigid substrates
poses challenges to the scaling of the TFT channel length. In this
study, a focused ion beam (FIB) based on Au and Ge ion sources is
employed to pattern a nanometric channel for flexible InGaZnO TFTs.
The FIB technique enables scaling the TFT channel length down to 78
and 73 nm using Au and Ge ion beams, respectively. However, induced
ion implantation in the substrate leads to significant changes in
the electrical TFT performance. The DC and AC performance of the TFTs
with Au-milled channels demonstrate a notable improvement compared
to the TFTs with Ge-milled channels, resulting in a field-effect mobility
of 3 cm2 V–1 s–1 and
a transit frequency of 80.8 MHz. These values are six and ten times
higher, respectively, than those of the Ge-milled TFTs. Furthermore,
logic NOT gates consisting of two FIB-milled TFTs in a diode load
configuration are reported, suggesting the compatibility of this approach
for implementing scaled circuits on flexible substrates.