Accelerated Aging Test of Metallized Film Capacitors in Modular Multilevel Converter Based on Mission Profile Emulator

Ling, Xi; Zhang, Yalin; Yu, Xin; Ma, Ke

doi:10.1109/peas58692.2023.10395615

2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS) 2023

DOI: 10.1109/peas58692.2023.10395615

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Accelerated Aging Test of Metallized Film Capacitors in Modular Multilevel Converter Based on Mission Profile Emulator

Xi Ling,

Yalin Zhang,

Xin Yu

et al.

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Accelerated Aging Test of Metallized Film Capacitors in Modular Multilevel Converter Based on Mission Profile Emulator

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References 14 publications

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