2024 IEEE Silicon Nanoelectronics Workshop (SNW) 2024
DOI: 10.1109/snw63608.2024.10639234
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Accelerated Program Inhibition Failure by Trap-Mediated Tunneling in the Polycrystalline Floating-Channel 3-D NAND Flash Memory Array

Soomin Kim,
Unsang Lee,
Yeji Lee
et al.
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