Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection

Sanyal, Subrata; Bhattacharya, Mukul; Dasgupta, Pallab; Patra, Amit

doi:10.1109/vlsid57277.2023.00072

2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) 2023

DOI: 10.1109/vlsid57277.2023.00072

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Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection

Subrata Sanyal

Mukul Bhattacharya

Pallab Dasgupta

et al.

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Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection

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References 20 publications

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