2011 Sixteenth IEEE European Test Symposium 2011
DOI: 10.1109/ets.2011.58
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Accelerating RTL Fault Simulation through RTL-to-TLM Abstraction

Abstract: Different fault injection techniques based on simulation have been proposed in the past for functional verification of register transfer level (RTL) IP models. They allow designers to model any type of fault and provide the quality of test patterns through the fault coverage estimation. Nevertheless, the low speed of such a cycle-accurate RTL simulation involves a trade-off between the simulation time and the achieved fault coverage.On the other hand, Transaction-level modeling (TLM) allows a simulation speed-… Show more

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Cited by 10 publications
(3 citation statements)
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References 16 publications
(17 reference statements)
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“…Bombieri et al [25] in 2011 utilize Transaction-Level Modeling vastly used for functional verification at the system level in order to optimize the fault simulation. The proposed approach claims the automatic extraction of the TLM models from the RTL description.…”
Section: Acceleration Via Complexity Abstractionmentioning
confidence: 99%
“…Bombieri et al [25] in 2011 utilize Transaction-Level Modeling vastly used for functional verification at the system level in order to optimize the fault simulation. The proposed approach claims the automatic extraction of the TLM models from the RTL description.…”
Section: Acceleration Via Complexity Abstractionmentioning
confidence: 99%
“…To achieve this, several approaches have been recently investigated, such as mutation schema [21], model abstraction [28], hardware acceleration [29], software emulation [30], and directed test generation [20,22].…”
Section: Testbench Qualificationmentioning
confidence: 99%
“…There has been a massive amount of research trying to improve the fault simulation time on single-core [6], [7] and multi-core systems [8], [9]. Beside the ideas to improve the simulation of circuit, e.g., event-driven and multi-thread simulation techniques, there has been several ideas that exploit the independent effect of different faults on the circuit to increase the parallelization of fault simulation, e.g., parallel fault simulation [8], [9] and concurrent fault simulation [10].…”
Section: Introductionmentioning
confidence: 99%