2010
DOI: 10.1002/adma.201000883
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Accounting for Interference, Scattering, and Electrode Absorption to Make Accurate Internal Quantum Efficiency Measurements in Organic and Other Thin Solar Cells

Abstract: Accurately measuring internal quantum efficiency requires knowledge of absorption in the active layer of a solar cell. The experimentally accessible total absorption includes significant contributions from the electrodes and other non‐active layers. We suggest a straightforward method for calculating the active layer contribution that minimizes error by subtracting optically‐modeled electrode absorption from experimentally measured total absorption.

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Cited by 669 publications
(636 citation statements)
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“…1a-d, which show the device structure, photo-generated carrier distribution profile, and the EQE and absorption spectra of the photo-active layers, respectively. Although the figures are schematics for illustrative purposes, knowledge of the optical constants (n and k see Methods) of all layers in the diode structure allows one to accurately simulate the actual optical field distributions, EQE and absorption using a transfer matrix analysis 29,39,40 . In this case the PCDTBT:PC70BM optical constants are used to demonstrate the concept.…”
Section: Resultsmentioning
confidence: 99%
“…1a-d, which show the device structure, photo-generated carrier distribution profile, and the EQE and absorption spectra of the photo-active layers, respectively. Although the figures are schematics for illustrative purposes, knowledge of the optical constants (n and k see Methods) of all layers in the diode structure allows one to accurately simulate the actual optical field distributions, EQE and absorption using a transfer matrix analysis 29,39,40 . In this case the PCDTBT:PC70BM optical constants are used to demonstrate the concept.…”
Section: Resultsmentioning
confidence: 99%
“…As shown in Fig. 8-1(b), the IQE exhibits larger variations for above bandgap illumination than inorganic solar cells and is consistent with previous reports that IQE is not a consistant value for all the wavelengths [121]. This is maybe due to surface scattering, the accuracy of the active layer thickness measurement, and the uniformity of the films.…”
Section: I-v Curve Simulation Including R S and R Shsupporting
confidence: 78%
“…Since it is not at 640 nm, we encounter a similar issue. There are also other factors, such as surface scattering, the accuracy of the active layer thickness measurement, and the uniformity of the films that may affect the results [121].…”
Section: I-v Curve Simulation Including R S and R Shmentioning
confidence: 99%
“…To address this issue, we calculated the 1D laser intensity profile for the GaN-on-SiC epilayer structure described in Section III. A (30 nm Al0.25Ga0.75N, 1.2 µm GaN, 100 nm AlN, and 100 µm 4H-SiC) using the optical transfer matrix formalism [56] and indices of refraction at 488 nm reported in the literature [57]- [58]. As a conservative approximation, we also set the absorption coefficient of each layer equal to = 0.1 µm -1 .…”
Section: Non-uniform Optical Samplingmentioning
confidence: 99%