2024
DOI: 10.1088/1361-6501/ad204d
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Accuracy assessment of crystal orientation indexations by EBSD

Qiwei Shi,
Dominique Loisnard,
Yang Li
et al.

Abstract: Accuracy and uncertainty analyses are essential for every measurement technology. In crystal orientation indexation by electron backscatter diffraction (EBSD), a series of accuracy estimations have been made for the Hough transform and dictionary indexation methods. The mean angular deviation is a standard parameter to indicate orientation accuracy, but this criterion is indirect and closely related to the accuracy of the projection center coordinates. Precise known orientation relationships are necessary t… Show more

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