“…In TAAM, instead of refining the parameters of atomic electron density, they are simply constrained to values typical for the corresponding atom type. The use of TAAM instead of IAM in the crystal structure refinement procedure with the standard diffraction [d min 0.83 Å , sin / = 0.6 Å À1 recommended in the crystallographic journals (Spek, 2003(Spek, , 2020] has largely improved the X-H bond lengths which became comparable to corresponding averaged neutron lengths (Dittrich et al, 2005Bendeif & Jelsch, 2007;Domagała et al, 2011;Dadda et al, 2012;Ahmed et al, 2011;Bąk et al, 2011;Dittrich et al, 2017). Other refinement parameters, such as reliability factor (R f ) and residual densities, are also improved Volkov et al, 2004;Pichon-Pesme et al, 2004;Bąk et al, 2011).…”