2014 6th European Embedded Design in Education and Research Conference (EDERC) 2014
DOI: 10.1109/ederc.2014.6924391
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Accurate dynamic characterization of sine-waves by means of the ADS1258EVM-PDK KIT

Abstract: This paper is focused on the estimation of the dynamic parameters of a sine-wave by means of the ADS1258EVM-PDK kit. The dynamic parameters are the SIgnal-to-Noise And Distortion (SINAD) ratio, Effective Number Of Bits (ENOB), Total Harmonic Distortion (THD) ratio, and Spurious Free Dynamic Range (SFDR) ratio. These parameters are estimated by both frequency-domain and time-domain methods. In the former approach the estimates are those returned by the MultiFFT test available in the ADCPro evaluation software o… Show more

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