Accurate exponential histogram test method for ADC linearity test

Abstract

An accurate exponential histogram test (EHT) method is proposed for the ADC linearity test. Different from conventional EHT methods which estimate ADC static parameters only based on the number of hits, the proposed method accurately estimates the ADC transition levels, differential non-linearity and integral non-linearity by creative utilisation of the information of stimulus signal. As a result, the proposed method avoids the errors introduced by the assumed proportional relationship between the code width and the number of hits in conventional methods. Simulation results show that the proposed method outperforms the conventional methods in terms of accuracy and robustness.