2007
DOI: 10.1364/ol.32.002954
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Accurate measurement of scattering and absorption loss in microphotonic devices

Abstract: We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials in which both nonlinear and linear absorption are present and requires only limited knowledge of absolute optical power levels, material parameters, and the structure geometry. The technique is applied to high-quality-factor (Q =1ϫ 10 6 to Q =5ϫ 10 6 ) silicon-on-insulator (S… Show more

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Cited by 39 publications
(24 citation statements)
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“…The asymmetry in the generated SH spectrum mirrors that of the transmission spectrum at the fundamental wavelength. This type of power-dependent lineshape distortion has been observed in other microphotonic devices293031 and is attributed to thermal and higher-order nonlinear effects. The lineshape distortion that limits conversion may be ameliorated by surface treatment31.…”
Section: Discussionsupporting
confidence: 66%
“…The asymmetry in the generated SH spectrum mirrors that of the transmission spectrum at the fundamental wavelength. This type of power-dependent lineshape distortion has been observed in other microphotonic devices293031 and is attributed to thermal and higher-order nonlinear effects. The lineshape distortion that limits conversion may be ameliorated by surface treatment31.…”
Section: Discussionsupporting
confidence: 66%
“…This type of measurement indicates any non-linear optical absorption and can be used to determine the linear absorption of a material [73]. Non-linear absorption would result in a change in the extinction ratio with respect 5.…”
Section: B Surface Treatmentmentioning
confidence: 99%
“…Also relevant would be to extend the above characterization by quantifying the separate contributions to the total measured loss due to scattering and linear absorption. A convenient technique for doing so has been presented by Borselli, et al 15 Chip ID# Propagation loss Coupling loss…”
Section: Device Characterizationmentioning
confidence: 99%