2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)
DOI: 10.1109/mwsym.2002.1011765
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Accurate prediction of PHEMT intermodulation distortion using the nonlinear discrete convolution model

Abstract: A k i a d -A general-purpose, technology-independenl behavioral model is adopted for the intermodulation performance prediction of PHEMT devices. The model can be easily identified since its nonlinear functions are directly related to conventional DC and small-signal differential parameter measurements. Experimental resulta which confirm the model accuracy at high operating frequencies are provided in the paper.

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Cited by 11 publications
(18 citation statements)
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“…Moreover, the wellknown and largely adopted pulsed -techniques [14]- [18] are based on the assumption that the state , which is associated with the device quiescent point ( , ) before the application of the superimposed voltage pulses, is not perturbed by either the pulse "shape" or amplitudes (i.e., by second and higher moments of the pulse waveforms) during the measurement of the device currents. Thus, (1) can be replaced by (2) According to conventional approaches, will be considered in the following as being linearly dependent on the average dissipated power under dynamic conditions , i.e., (3) where is the case (or substrate) temperature and is the device thermal resistance.…”
Section: A Formulation Of the "Above-cutoff" Dispersion Modelmentioning
confidence: 99%
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“…Moreover, the wellknown and largely adopted pulsed -techniques [14]- [18] are based on the assumption that the state , which is associated with the device quiescent point ( , ) before the application of the superimposed voltage pulses, is not perturbed by either the pulse "shape" or amplitudes (i.e., by second and higher moments of the pulse waveforms) during the measurement of the device currents. Thus, (1) can be replaced by (2) According to conventional approaches, will be considered in the following as being linearly dependent on the average dissipated power under dynamic conditions , i.e., (3) where is the case (or substrate) temperature and is the device thermal resistance.…”
Section: A Formulation Of the "Above-cutoff" Dispersion Modelmentioning
confidence: 99%
“…The LF model presented in the previous sections was embedded into a nonquasi-static large-signal device model for microwave and millimeter-wave applications, i.e., the NDC model [2]. To this aim, the NDC model was identified on the basis of bias-and frequency-dependent -parameters carried out by means of a 110-GHz VNA (HP8510XF).…”
Section: High-frequency Model Validationmentioning
confidence: 99%
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