Accurate Robustness Assessment of HDL Models Through Iterative Statistical Fault Injection

Tuzov, Ilya; Andrés, David de; Ruiz, Juan-Carlos

doi:10.1109/edcc.2018.00013

Cited by 11 publications

(6 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The peak of the SET distribution is used as SET duration in our experiments, i.e., 400 ps. Nine benchmarks from MiBench and PolyBench are analyzed, with a statistical fault injection (99.8% confidence interval, 5% error margin) [50].…”

Section: B Experimental Resultsmentioning

confidence: 99%

Functional and Timing Implications of Transient Faults in Critical Systems

Kritikakou

Nikolaou

Rodriguez-Ferrandez

et al. 2022

2022 IEEE 28th International Symposium on on-Line Testing and Robust System Design (IOLTS)

View full text Add to dashboard Cite

Embedded systems in critical domains, such as automotive, aviation, space domains, are often required to guarantee both functional and temporal correctness. Considering transient faults, fault analysis and mitigation approaches are implemented at various levels of the system design, in order to maintain the functional correctness. However, transient faults and their mitigation methods have a timing impact, which can affect the temporal correctness of the system. In this work, we expose the functional and the timing implications of transient faults for critical systems. More precisely, we initially highlight the timing effect of transient faults occurring in the combinational and sequential logic of a processor. Furthermore, we propose a full stack vulnerability analysis that drives the design of selective hardware-based mitigation for real-time applications. Last, we study the timing impact of software-based reliability mitigation methods applied in a COTS GPU, using a fault tolerant middleware.

show abstract

Section: B Experimental Resultsmentioning

confidence: 99%

Functional and Timing Implications of Transient Faults in Critical Systems

Kritikakou

Nikolaou

Rodriguez-Ferrandez

et al. 2022

2022 IEEE 28th International Symposium on on-Line Testing and Robust System Design (IOLTS)

View full text Add to dashboard Cite

show abstract

“…, where t is the critical value related to the statistical confidence interval, e the error margin, and p the percentage of the possible fault population individuals that are assumed to lead to errors [17].…”

Section: Gate-level Analysismentioning

confidence: 99%

Flodam: Cross-Layer Reliability Analysis Flow for Complex Hardware Designs

Kritikakou

Sentieys

Hubert

et al. 2022

2022 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE)

View full text Add to dashboard Cite

Modern technologies make hardware designs more and more sensitive to radiation particles and related faults. As a result, analysing the behavior of a system under radiationinduced faults has become an essential part of the system design process. Existing approaches either focus on analysing the radiation impact at the lower hardware design layers, without further propagating any radiation-induced fault to the system execution, or analyse system reliability at higher hardware or application layers, based on fault models that are agnostic of the fabrication technology and the radiation environment. FLODAM combines the benefits of existing approaches by providing a novel cross-layer reliability analysis from the semiconductor layer up to the application layer, able to quantify the risks of faults under a given context, taking into account the environmental conditions, the physical hardware design and the application under study.

show abstract

“…For the input data of each instruction, we repeated the fault injection experiments 1,000 with random data. Hence, 14,100 total fault injections are performed per instruction (1,000 × 141 bits), which corresponds to confidence interval of 98.25%, considering an error margin of 0.01% [19]. For each experiment, a fault-free execution is performed to obtain the golden references.…”

Section: Instruction Reliability Factormentioning

confidence: 99%