Accurate and Robust Spectral Testing With Relaxed Instrumentation Requirements 2018
DOI: 10.1007/978-3-319-77718-4_7
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Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test

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Cited by 4 publications
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“…Current advancements in semiconductor technologies have enabled designers to efficiently design integrated circuits (ICs) with increasingly improved performance [1]. These ICs have smaller volume, higher density, and increased switching speed, which could result in system critical electromagnetic compatibility (EMC) issues due to radiation and conduction [2], [3].…”
Section: Introductionmentioning
confidence: 99%
“…Current advancements in semiconductor technologies have enabled designers to efficiently design integrated circuits (ICs) with increasingly improved performance [1]. These ICs have smaller volume, higher density, and increased switching speed, which could result in system critical electromagnetic compatibility (EMC) issues due to radiation and conduction [2], [3].…”
Section: Introductionmentioning
confidence: 99%