2017
DOI: 10.1016/j.cossms.2016.05.010
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Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials

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Cited by 17 publications
(12 citation statements)
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References 176 publications
(259 reference statements)
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“…Lately, environmental transmission electron microscopy (E-TEM) has become a decisive tool for understanding the chemical activity of catalysts. Recent developments made it possible to achieve atomic resolution in environmental conditions, , both in a dedicated E-TEM , and in an environmental cell . Environmental electron microscopy has been combined with electron tomography (ET), enabling the 3D study of materials under specific conditions through the development of fast ET. , This last technique allows the reconstruction of the sample volume using tilt images recorded in 2–4 min with fast step-by-step tilting electron tomography (SBSET) or in several seconds with continuous rotation and recording electron tomography. , …”
Section: Introductionmentioning
confidence: 99%
“…Lately, environmental transmission electron microscopy (E-TEM) has become a decisive tool for understanding the chemical activity of catalysts. Recent developments made it possible to achieve atomic resolution in environmental conditions, , both in a dedicated E-TEM , and in an environmental cell . Environmental electron microscopy has been combined with electron tomography (ET), enabling the 3D study of materials under specific conditions through the development of fast ET. , This last technique allows the reconstruction of the sample volume using tilt images recorded in 2–4 min with fast step-by-step tilting electron tomography (SBSET) or in several seconds with continuous rotation and recording electron tomography. , …”
Section: Introductionmentioning
confidence: 99%
“…In this context, it is of great importance to revisit the local molecular-level surface structures of such small sized materials in comparison to those of the macroscopic ones. A series of characterization techniques, including attenuated total reflection infrared spectroscopy (ATR-IR), surface enhanced Raman scattering (SERS), X-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), etc. have been used to characterize such mesoscopic materials to obtain structural information like surface species, surface compositions, and surface morphologies, etc. Each characterization technique has its own advantage(s) over others.…”
Section: Introductionmentioning
confidence: 99%
“…While a strong development toward environmental TEM has occurred since the 70s, , detection capabilities did not allow routine atomic resolution under controlled atmosphere. With the advent of aberration-correction and high speed cameras in the past decade, HRTEM imaging has become a key technique to allow atomic-scale analysis in real time in environmental conditions. …”
mentioning
confidence: 99%