2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) 2010
DOI: 10.1109/rtp.2010.5623789
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Activation of silicon wafer by excimer laser

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Cited by 6 publications
(5 citation statements)
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“…The above spoken Raman characteristics indicated the presence of compressive strain in the film [51], supporting the formation of Q-carbon [31]. The chemical and surface changes induced by excimer laser wavelength were also observed for silicon and semiconductors [52,53] or silicon carbide [54][55][56]. The discussion on the correlation of surface morphology (e.g., SEM and AFM images) and I D /I G ratio changes were included in the papers [57,58].…”
Section: Raman Spectroscopymentioning
confidence: 78%
“…The above spoken Raman characteristics indicated the presence of compressive strain in the film [51], supporting the formation of Q-carbon [31]. The chemical and surface changes induced by excimer laser wavelength were also observed for silicon and semiconductors [52,53] or silicon carbide [54][55][56]. The discussion on the correlation of surface morphology (e.g., SEM and AFM images) and I D /I G ratio changes were included in the papers [57,58].…”
Section: Raman Spectroscopymentioning
confidence: 78%
“…For the dopant activation of the S/D in the TFT, excimer laser annealing (ELA) instead of RTA was applied. Because a penetration depth of an excimer laser is 6 nm and the first ILD is a good thermal insulator, thermal damage to the underlying TTSs and metal interconnections is preventable . Then, another TEOS of 300 nm was deposited as a second interlayer dielectric (2nd ILD) to avoid electrical short between upper metal interconnections and the TFTs.…”
Section: Resultsmentioning
confidence: 99%
“…Because a penetration depth of an excimer laser is 6 nm and the first ILD is a good thermal insulator, thermal damage to the underlying TTSs and metal interconnections is preventable. 18 Then, another TEOS of 300 nm was deposited as a second interlayer dielectric (2nd ILD) to avoid electrical short between upper metal interconnections and the TFTs. Then, a second level of holes and metal interconnections was followed to interconnect underlaying TTSs and superjacent TFTs.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Compared to the poly‐Si channel thickness of 50 nm and poly‐Si gate thickness of 100 nm and the first ILD layer with a thickness of 300 nm, the penetration depth of ≈6 nm stemming from its short wavelength is shallow. [ 38 ] Thus, the heat induced by ELA cannot be transferred to other areas apart from the exposed S/D of the 1TFT‐synapse.…”
Section: Resultsmentioning
confidence: 99%