Active-amplifier-array diagnostics using high-resolution electrooptic field mapping

Yang, Kiyull; Marshall, T.; Forman, Michael A.; Hubert, J.; Mirth, Lee; Popović, Zoya; Katehi, L.P.B.; Whitaker, J.F.

doi:10.1109/22.920140

Cited by 30 publications

(12 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Each element of the array must respond in phase, or the amplifier will lose efficiency. While EO field-mapping has been used to diagnose issues with full arrays that are not performing to specification [11], in this case we elect to only demonstrate an amplitude and phase measurement on one unit cell of the array.…”

Section: Electro-optic Field Mappingmentioning

confidence: 99%

Near-field microwave diagnostics with nonlinear-optical sensors

Whitaker

Yang²,

Chen

2007

SPIE Proceedings

View full text Add to dashboard Cite

The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electrooptic field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of emerging materials, such as diluted magnetic semiconductors, is also considered.

show abstract

Section: Electro-optic Field Mappingmentioning

confidence: 99%

Near-field microwave diagnostics with nonlinear-optical sensors

Whitaker

Yang²,

Chen

2007

SPIE Proceedings

View full text Add to dashboard Cite

show abstract

“…The antennas for acquisition of normal and tangential components of the electric field are usually different: in most cases, for the latter, small dipoles are used [9], [10]. Simultaneous mapping of the various spatial-field components using an alternative approach with electrooptical detection was also reported [11].…”

Section: Acquisition Of Tangential Components Of the Electric Fieldmentioning

confidence: 99%

Measurement of electric-field intensities using scanning near-field microwave microscopy

Kantor

Shvets

2003

IEEE Trans. Microwave Theory Techn.

View full text Add to dashboard Cite

Abstract-In this paper, we propose methods for the measurement of electric intensities of a microwave field above the surface of microwave circuits. Using miniaturized coaxial antennas, we measure all spatial components of the induced field above device-under-test. A special position/signal difference method is used to better localize the measured field and increase the spatial resolution of the field mapping. During the scanning process, the antenna is driven at the defined distance above the sample surface according to previously acquired topographic data. For measurement of the tangential-field components parallel to the sample surface, the antenna is tilted by approximately 45 relative to the sample surface. By its rotation about the vertical axis, various components of the field are measured, and vertical and horizontal electric-field intensities are recalculated. The probes are calibrated in a well-defined field standard and allow good quantitative characterization of the measured field.Index Terms-Coaxial antennas, near-field measurements, scanning near-field microscopy.

show abstract

“…During the past several years, a researchprototype electro-optic (EO) near-field imaging system has been under development at the University of Michigan. The EO field-mapping technique, in which various electro-optic crystals have been utilized as both electric field and temperature sensors, has been demonstrated to provide a thorough picture of the physical phenomena underlying the operation of a variety of microwave integrated circuits, antennas, and arrays [9], [10].…”

Section: Experimental Validationmentioning

confidence: 99%

Global coupled EM-electrical-thermal simulation and experimental validation for a spatial power combining MMIC array

Batty

Christoffersen

Yakovlev

et al. 2002

IEEE Trans. Microwave Theory Techn.

Self Cite

View full text Add to dashboard Cite

Abstract-The first fully coupled electromagneticelectro-thermal global simulation of a large microwave subsystem, here a whole spatial power combining MMIC array, is described. The modeling effort is supported by parallel developments in electro-optic and thermal measurement. The CAD tools and experimental characterisation described, provide a unique capability for the design of quasi-optical systems and for the exploration of the fundamental physics of spatial power combining devices.

show abstract

Active-amplifier-array diagnostics using high-resolution electrooptic field mapping

Cited by 30 publications

References 15 publications

Near-field microwave diagnostics with nonlinear-optical sensors

Near-field microwave diagnostics with nonlinear-optical sensors

Measurement of electric-field intensities using scanning near-field microwave microscopy

Global coupled EM-electrical-thermal simulation and experimental validation for a spatial power combining MMIC array

Contact Info

Product

Resources

About