Active learning in physics a way for rational thinking, a way for development

Lakhdar, Z. Ben; Derbel, Najoua; Dhaouadi, Zoubeida; Ghalila, Hassen; Miled, R.; Lahmar, S.; Berrada, Khalid; Channa, Rafik; Outzourhit, A.

doi:10.1117/12.2207802

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“…Workshops organized within the framework of the project ''Active Learning in Optics and Photonics" (ALOP) mainly funded by UNESCO, with the support of ICTP (Abdus Salam International Centre for Theoretical Physics) and SPIE (Society of Photo-Optical Instrumentation Engineers) aim to make simpler the introduction of this phenomenon and to accompany the classical mathematical approach [1][2][3][4][5]. This ALOP project consists in a series of workshops for educators, researchers and students and promotes an innovative method of teaching physics using simple, inexpensive material that can be fabricated locally.…”

Section: Introductionmentioning

confidence: 99%

Active learning in optics and photonics: Fraunhofer diffraction

Ghalila

Lakhdar

Lahmar

et al. 2014

12th Education and Training in Optics and Photonics Conference

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ABSTRACT''Active Learning in Optics and Photonics" (ALOP), funded by UNESCO within its Physics Program framework with the support of ICTP (Abdus Salam International Centre for Theoretical Physics) and SPIE (Society of Photo-Optical Instrumentation Engineers), aimed to helps and promotes a friendly and interactive method in teaching optics using simple and inexpensive equipment. Many workshops were organized since 2005 the year when Z. BenLakhdar, whom is part of the creators of ALOP, proposed this project to STO (Société Tunisienne d'Optique). These workshops address several issues in optics, covering geometrical optics, wave optics, optical communication and they are dedicated to both teachers and students. We focus this lecture on Fraunhofer diffraction emphasizing the facility to achieve this mechanism in classroom, using small laser and operating a slit in a sheet of paper. We accompany this demonstration using mobile phone and numerical modeling to assist in the analysis of the diffraction pattern figure.

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