Active timing multilevel fault-simulation with switch-level accuracy

Meyer, W.; Camposano, Raúl

doi:10.1109/43.466340

Cited by 18 publications

(4 citation statements)

References 36 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The new theorem has been used to solve the long standing problem of designing validation experiments for this class of systems. Trials to establish (1-π) at the 100(1-1e-10)% level State probability for given (1-π) 7 (1000/6) α 2 ω (1-π) = (1-π) 1.38e-7 1e-3 23,000 1.38e-10 10 (10000/24) α 2 β ω (1-π) = (1-π) 1.47e-9 1e-2 2,290 1.47e-11 18 (10000/24) α 2 β ω (1-π) = (1-π) 1.47e-9 1e-2 2,290 1.47e-11 32 (100/2) α β (10/3600) ω (1-π) = (1-π) 1.17e-9 1e-2 2,290 1.17e-11 35 (10000/24) α 2 β ω (1-π) = (1-π) 1.52e-9 1e-2 2,290 1.52e-11 subtotal 32,160 1.943e-10…”

Section: Discussionmentioning

confidence: 99%

Fault Injection for Semi-Parametric Reliability Models

White

2005

2005 IEEE Aerospace Conference

View full text Add to dashboard Cite

show abstract

Section: Discussionmentioning

confidence: 99%

Fault Injection for Semi-Parametric Reliability Models

White

2005

2005 IEEE Aerospace Conference

View full text Add to dashboard Cite

show abstract

“…A multilevel fault simulator operating at switch-and gate-levels is described in [4]. It supports the inertial delay model.…”

Section: State-of-the-artmentioning

confidence: 99%

Laser-Induced Fault Simulation

Natale

Flottes

et al. 2013

2013 Euromicro Conference on Digital System Design

View full text Add to dashboard Cite

This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multilevel process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.

show abstract

“…To the best of our knowledge, among the existent fault simulators [6,12,18,21,24], the most recent one is [19], which is based on the open-source Lifting [1]. The major issue with these fault simulators is that they rely on electrical models [8,11,25] that are technology dependent.…”

Section: Introductionmentioning

confidence: 99%

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits

Viera

Dutertre

Maurine

et al. 2018

Proceedings of the 2018 International Symposium on Physical Design

View full text Add to dashboard Cite

Designing secure integrated systems requires methods and tools dedicated to simulating -at early design stages-the effects of laserinduced transient faults maliciously injected by attackers. Existing methods for simulation of laser-induced transient faults do not take into account IR drop effects that are able to cause timing failures, abnormal reset, and sram flipping. This paper proposes a novel standard cad tool-based method allowing to simulate laser-induced faults in large-scale circuits. Thanks to a power-grid network modeled by a commercial IR drop cad tool, an additional transient current component causing laser-induced IR drop is taken into consideration. This current component flows from v DD to g ND and may have a significant effect on the fault injection process. The method provides fault sensitivity maps that enable a quick assessment of laser-induced fault effects on the circuit under analysis. As shown in the results, the number of induced faults is underestimated by a factor as large as 3.1 if laser-induced IR drop is ignored. This may lead to incorrect estimations of the fault injection threshold, which is especially relevant for the design of countermeasure techniques for secure integrated systems. Simulation times regarding four different circuits are also presented in the results section.

show abstract

Active timing multilevel fault-simulation with switch-level accuracy

Cited by 18 publications

References 36 publications

Fault Injection for Semi-Parametric Reliability Models

Fault Injection for Semi-Parametric Reliability Models

Laser-Induced Fault Simulation

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits

Contact Info

Product

Resources

About