2013
DOI: 10.3390/s131217067
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Adaptation of Soil Physical Measurement Techniques for the Delineation of Mud and Lakebed Sediments at Neusiedler See

Abstract: For many water management issues of shallow lakes with non-consolidated sediments hydrographic surveys of the open water area and reed belt areas are required. In the frame of water management strategy for the steppe lake Neusiedler See, located between Austria and Hungary, a hydrographic survey was conducted. In the open water area (water depth ≥1 m) a sediment echosounder was used. To validate these measurements and to distinguish between water, mud, and sediment layers in the shallow lake and reed belt area… Show more

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Cited by 5 publications
(8 citation statements)
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“…The CSPS in a measuring system was designed for sediment layer delineation in shallow lakes, described in Kogelbauer et al (2013) (Fig. 1, left panel).…”
Section: Csps In a Measuring System And Its Performance In The Fieldmentioning
confidence: 99%
See 2 more Smart Citations
“…The CSPS in a measuring system was designed for sediment layer delineation in shallow lakes, described in Kogelbauer et al (2013) (Fig. 1, left panel).…”
Section: Csps In a Measuring System And Its Performance In The Fieldmentioning
confidence: 99%
“…For this, software (GeneCon) was programmed in C# as the main part of the data acquisition system (see also Kogelbauer et al, 2013). Additional software (GenePost) was programmed for post processing.…”
Section: Data Acquisition Software and Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…The CSPS in a measuring system was designed for sediment layer delineation in shallow lakes, described in Kogelbauer et al (2013) The two sensors were combined with GNSS RTK positioning for dynamic vertical profile measurements with precise location information (x, y, z) of ±35 cm in overall accuracy.…”
Section: Csps In a Measuring System And Its Performance In The Fieldmentioning
confidence: 99%
“…In the visible and infrared range, as the wavelength increases, the penetration depth into the dielectric layer increases. At the same time, the ohmic loss of metal layers reduces reversely [22]. In particular, the ohmic loss is very low in the far infrared region, where it has a perfect reflection characteristic.…”
Section: Introductionmentioning
confidence: 99%