Adaptive characterization of recrystallization kinetics in IF steel by electron backscatter diffraction

Abstract

SummaryIn this study, a rigorous methodology for quantifying recrystallization kinetics by electron backscatter diffraction is proposed in order to reduce errors associated with the operator's skill. An adaptive criterion to determine adjustable grain orientation spread depending on the recrystallization stage is proposed to better identify the recrystallized grains in the partially recrystallized microstructure. The proposed method was applied in characterizing the microstructure evolution during annealing of interstitial-free steel cold rolled to low and high true strain levels of 0.7 and 1.6, respectively. The recrystallization kinetics determined by the proposed method was found to be consistent with the standard method of Vickers microhardness. The application of the proposed method to the overall recrystallization stages showed that it can be used for the rigorous characterization of progressive microstructure evolution, especially for the severely deformed material.

User‐independent EBSD parameters to study the progress of recovery and recrystallization in Cu–Zn alloy during in situ heating

“…This distinction has been previously done (Kim et al, 2013) using GOS parameter, which represents the average spread in the orientation of all the pixels in a grain from the average orientation of this grain. The difference between deformed grains and new strain-free grains is in terms of the strain accumulated inside these grains in the form of dislocations.…”

“…The difference between deformed grains and new strain-free grains is in terms of the strain accumulated inside these grains in the form of dislocations. This distinction has been previously done (Kim et al, 2013) using GOS parameter, which represents the average spread in the orientation of all the pixels in a grain from the average orientation of this grain. Variation in GOS value is plotted in Figure 7 for each of the sample conditions during recrystallization.…”

“…The latter one include kernel average misorientation, grain average misorientation and grain orientation spread (GOS) (Mitsche et al, 2007;Kim et al, 2013;Raghavan et al, 2013). These parameters mainly include diffraction pattern quality-based parameters and misorientation-based parameters.…”

“…These parameters mainly include diffraction pattern quality-based parameters and misorientation-based parameters. Comparisons between each of these parameters including their limitations have been discussed (Wright, 1999;Mitsche et al, 2007;Dziaszyk et al, 2010;Kim et al, 2013). Other parameters such as pattern quality and boundary fraction (Jazaeri & Humphreys, 2004) can be obtained not only through point count and line scans but also by using EBSD area maps.…”

“…Other parameters such as pattern quality and boundary fraction (Jazaeri & Humphreys, 2004) can be obtained not only through point count and line scans but also by using EBSD area maps. Comparisons between each of these parameters including their limitations have been discussed (Wright, 1999;Mitsche et al, 2007;Dziaszyk et al, 2010;Kim et al, 2013). Apart from the limitations to the use of above parameters, they are also prone to user-induced human errors because all of them require some user input for defining the parameter.…”