ADC Production Test Technique Using Low‐Resolution Arbitrary Waveform Generator

Kerzérho, Vincent; Cauvet, Philippe; Bernard, Serge; Azaïs, Florence; Renovell, Michel; Comte, Mariane; Chakib, O.

doi:10.1155/2008/482159

Cited by 4 publications

(6 citation statements)

References 15 publications

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“…The architecture was first utilized in experimental pulse-code-modulation systems by Bell Labs in the 1940s. Bernard Gordon, at Epsco, introduced the first commercial vacuum-tube SAR ADC in 1954; an 11-bit, 50-kSPS ADC that dissipated 500 W. 1 The principle of the SAR consists of a sample-and-hold (S/H) circuit, a comparator, a DAC and a logic control unit. ADC employs a binary search algorithm that uses the digital logic circuitry to determine the value of each bit in a sequential or successive manner based on the outcome of the comparison between the outputs of the S/H circuit and DAC feedback from a capacitor array [9].…”

Section: Sar Conversion Principlementioning

confidence: 99%

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Design and implementation of a platform for experimental testing and validation of analog-to-digital converters: static and dynamic parameters

Mansour¹,

Maghrebi²,

Sifi³

et al. 2017

Int. J. Metrol. Qual. Eng.

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Abstract. This paper presents an implementation of a data acquisition system for analog-to-digital converters (ADCs) using "Laboratory Virtual Instrument Engineering Workbench (LabVIEW)" as software for data analysis. The designed and implemented platform allows interaction with the device under test through means of data acquisition and instrument controls. Developing custom tests in LabVIEW can result in reduced test time, which in turn will help reduce costs in testing. This system was developed for evaluation purposes of ADC's static and dynamic parameters (gain error, offset error, DNL, INL, SNR, SINAD, IMD, etc.) using single and multifrequency signals. The virtual control and analysis instrument was created in "LabVIEW" environment to control test signals generation and data acquisition. The testing performance of the platform is demonstrated using the classical ADC circuit "ADC0804". A comparison with experimental results obtained by CANTEST platform from Bordeaux University (France) is also presented to highlight our platform.

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Section: Sar Conversion Principlementioning

confidence: 99%

“…Analog-to-digital converters (ADCs) are nowadays part of complex systems developed for various applications such as medical applications, telecommunications, and consumer applications [1]. They translate analog electrical signals representing real-world: light, sound, temperature or pressure to binary numbers.…”

Section: Introductionmentioning

confidence: 99%

Design and implementation of a platform for experimental testing and validation of analog-to-digital converters: static and dynamic parameters

Mansour¹,

Maghrebi²,

Sifi³

et al. 2017

Int. J. Metrol. Qual. Eng.

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“…The Analogue Network of Converters, presented in [12], is a DfT concept developed to enable the fully digital test of a set of DACs and ADCs embedded in a complex system. It can also be used to relax the requirements on the test equipment in case of stand-alone converter testing [13].…”

Section: Anc Fundamental Principlementioning

confidence: 99%

“…The fault masking is avoided by using a post-processing algorithm that discriminates harmonics from the different converters inserted in the test path. The ANC-based method can also be exploited to test standalone ADCs using low resolution arbitrary waveform generators as it breaks the rule stating that the test equipment resolution should be at least 2 bits higher than the ADC under test [13].…”

Section: Introductionmentioning

confidence: 99%

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

et al. 2011

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This paper presents an extension of the ANC ("Analogue Network of Converters")-based method, which is an original Design-for-Test (DfT) technique associated to a dedicated test algorithm to characterize the harmonic components of a set of embedded converters using only digital test resources. The ANC-based method was primarily developed under the assumption that the harmonics' phase is proportional to the input phase. This assumption is not valid for all converter architectures, where filtering effects may affect the harmonics' phase. The improved ANC-based method is able to calculate the magnitude of the harmonic components with unknown phase. The fundamental principle of this improved version of the ANC-based method is the same, but further mathematical developments have been established using a model independent from the harmonics' phase. The simulation results and the experiments show an excellent agreement between the values measured using the method and the values measured with a usual test setup, for the THD and SFDR parameters. Simulations were carried out considering both random phases and realistic phase delays such as the ones induced by a low pass filter.

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“…The fault masking is avoided by using a postprocessing algorithm that discriminates harmonics from the different converters inserted in the test path. The ANC-based method can also be exploited to test standalone ADCs using low resolution arbitrary waveform generators as it breaks the rule stating that the test equipment resolution should be at least 2 bits higher than the ADC under test [13].…”

Section: Introductionmentioning

confidence: 99%

ANC-based method for testing converters with random-phase harmonics

Kerzérho

Azaïs

Comte

et al. 2010

2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW)

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In this paper, we present an extension of the ANC ("Analogue Network of Converters")-based method to characterize the harmonic components of a set of converters with random-phase harmonics using only digital test resources. The ANC-based method was primarily developed under the assumption that the harmonics' phase is proportional to the input phase. This assumption is not valid for all converter architectures, where filtering effects may affect the harmonics' phase. The improved ANC-based method is able to calculate the magnitude of the harmonic components regardless of their phase. The simulation results and the experiments show an excellent agreement between the values measured using the method and the values measured with a usual test setup, for the THD and SFDR parameters.

show abstract

ADC Production Test Technique Using Low‐Resolution Arbitrary Waveform Generator

Cited by 4 publications

References 15 publications

Design and implementation of a platform for experimental testing and validation of analog-to-digital converters: static and dynamic parameters

Design and implementation of a platform for experimental testing and validation of analog-to-digital converters: static and dynamic parameters

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

ANC-based method for testing converters with random-phase harmonics

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