2011
DOI: 10.1017/s1431927611003758
|View full text |Cite
|
Sign up to set email alerts
|

Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
1
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 3 publications
1
1
0
Order By: Relevance
“…The analytical precision on Ti‐in‐NIST 610 is established at 427–468 ppm (mean: 437 ± 26 ppm; 2σ = 5.89%; Table S3 and Figure 4c). The standard deviation values obtained for these standards fall well within the accepted error limit of trace element analysis (i.e., ~10%; Jercinovic, 2019). Based on reproduced standard results, we chose the NIST‐610 standard, which yielded better precision as compared with other standards, to re‐run after every 10 measurements on natural quartz and zircon samples (Figure 4d).…”
Section: Methodssupporting
confidence: 68%
“…The analytical precision on Ti‐in‐NIST 610 is established at 427–468 ppm (mean: 437 ± 26 ppm; 2σ = 5.89%; Table S3 and Figure 4c). The standard deviation values obtained for these standards fall well within the accepted error limit of trace element analysis (i.e., ~10%; Jercinovic, 2019). Based on reproduced standard results, we chose the NIST‐610 standard, which yielded better precision as compared with other standards, to re‐run after every 10 measurements on natural quartz and zircon samples (Figure 4d).…”
Section: Methodssupporting
confidence: 68%
“…The primary cause for most accuracy errors is the result of spectral interference of different elements and/or the determination of background intensity. 24,55,56 To avoid these situations, we undertook highsensitivity wavelength scans on each side of the peak for Sc, Zr, Nb, Ti, Fe, Mn, Co, Cr, V, and Ni using the ilmenite standard to identify peak positions and optimal background positions. There are two main types of spectral interference for trace elements in ilmenite: (1) spectral interferences from secondary emission lines of major elements in the sample matrix, such as peak overlaps of Ti (Kb) to V (Ka) and Fe (Kb) to Co (Ka); and (2) spectral interference by secondary lines from other trace elements, such as peak overlaps of Cr (Kb) to Mn (Ka) and V (Kb) to Cr (Ka) (Fig.…”
Section: Jaas Papermentioning
confidence: 99%