2019
DOI: 10.1016/j.micron.2018.12.001
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Addressing some of the technical challenges associated with liquid phase S/TEM studies of particle nucleation, growth and assembly

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Cited by 28 publications
(29 citation statements)
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“…Here, a (S)TEM device operated at an acceleration voltage of 300 kV is utilized. Use a low dose to minimize beam-induced artifacts and a short exposure time to avoid movementrelated blurring 34 .…”
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confidence: 99%
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“…Here, a (S)TEM device operated at an acceleration voltage of 300 kV is utilized. Use a low dose to minimize beam-induced artifacts and a short exposure time to avoid movementrelated blurring 34 .…”
mentioning
confidence: 99%
“…In case of long-term experiments, block the beam to reduce radiation damage. NOTE: Due to a better temporal resolution, TEM is to be preferred over STEM for kinetic analyses 34 and reduced ion reduction…”
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confidence: 99%
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“…[400][401][402][403][404][405] Other related elds such as superlattice self-assembly from NPs are also treated. 406 Though some studies dealing with HNSs exist, 407,408 we envision that a more extensive application of these techniques would thrive, mainly when applied to lowertemperature reactions and some technical limitations (see, for example, a tutorial by De Yoreo and co-workers) 409 are solved.…”
Section: Perspectivementioning
confidence: 99%
“…The surface scanning technique has limitations to observe the crystallization process in a solution. Upon this demand, the liquid phase electron microscope was developed, which combines the temporal and spatial resolution of electron microscopy with the ability to image events occurring in bulk solutions [17,18]. With the use of the liquid phase electron microscope, the crystallization of barium tungstate was monitored, which indicated that the complex morphologies grow through a classical growth mechanism, rather than the long-term supposing nonclassical crystallization [19].…”
Section: Introductionmentioning
confidence: 99%