2019
DOI: 10.1016/j.jaerosci.2019.105431
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Adhesion of tungsten particles on rough tungsten surfaces using Atomic Force Microscopy

Abstract: Adhesion forces between tungsten spherical microparticles and tungsten substrates with different roughnesses have been measured using the Atomic Force Microscopy (AFM) colloidal probe technique. Mean roughnesses of the tungsten substrates were measured by AFM and were ranked in three categories i.e. nanoscale, sub-microscale and microscale roughnesses. Experimental Hamaker constant of 37 ± 3.5 × 10 −20 J has been obtained using a spherical tungsten particle of 10.5 µm in radius and a tungsten substrate with na… Show more

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Cited by 43 publications
(44 citation statements)
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“…The model can be used with a constant or a variable friction velocity according to the model formulation. It has to be noticed here that the Biasi correlation, which has been obtained with various experiments, could be replaced in a future work by real adhesion force distributions obtained by means of atomic force microscopy technique in the specific case of tungsten particles deposited on tungsten substrates [17].…”
Section: Resultsmentioning
confidence: 99%
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“…The model can be used with a constant or a variable friction velocity according to the model formulation. It has to be noticed here that the Biasi correlation, which has been obtained with various experiments, could be replaced in a future work by real adhesion force distributions obtained by means of atomic force microscopy technique in the specific case of tungsten particles deposited on tungsten substrates [17].…”
Section: Resultsmentioning
confidence: 99%
“…For a particle to be resuspended, airflow forces have to be at least equal to the adhesion forces. In reality, the particles are not spherical and nor smooth and they are generally deposited on rough surfaces [17]. Hence, adhesion forces cannot be directly calculated by the expression in equation (3).…”
Section: Force (N )mentioning
confidence: 99%
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“…Fortunately, adhesion forces can be directly assessed using the Atomic Force Microscope (AFM) technique. Details on the technique and experimental procedure can be found in [12]. Adhesion force measurements have been realized with a Multimode 8 (Bruker) AFM in PeakForce Quantitative Nano-Mechanical mode (PF-QNM) in environmental conditions.…”
Section: Adhesion Of An Uncharged Particlementioning
confidence: 99%