Adjustment for profile deviations of gear involute artefacts

Abstract

Gear involute artifact (GIA) is a kind of measurement standard for calibrating the gear involute measuring instrument. To reduce the profile form deviations and the difference of the profile slope deviations between the opposite flanks (left and right flank) of GIA, the effect of installation eccentricity on the profile deviations is analysed, and an adjustment method for profile deviations of GIA by the eccentric installation is proposed. The difference of profile slope deviations between the opposite flanks of GIA with designed base circle radius r b=100 mm changes from 0.31 μm to 0.1 μm after the adjustment through the eccentricity of the mandrel itself. The difference of profile slope deviations between the opposite flanks of GIA with designed base circle radius r b=60cos20° mm changes from 0.77 μm to 0.12 μm after the adjustment through a kind of rotary stroke bearing with eccentricity, meanwhile, the profile form deviations are reduced from 0.53 μm to 0.34 μm (right flank) and 0.89 μm to 0.46 μm (left flank). This adjustment method could improve the used accuracy of GIA without improving the machining accuracy of the involute and changing the measurement process of the measurement standard of GIA.

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