2008
DOI: 10.1016/j.apsusc.2007.12.004
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Adsorption and deposition of anthraquinone-2-carboxylic acid on alumina studied by inelastic electron tunneling spectroscopy, infrared reflection absorption spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy

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Cited by 10 publications
(6 citation statements)
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“…When the hydrogel was contacted with the copper ions solution (sample A1‐Cu), the carbon spectrum was fitted with three curve components [Figure (a)], similar to the sample before copper adsorption, but in this case the intensity at 288.0 eV increased indicating a higher content of carbonyl carbon. This carbonyl observed by XPS corresponds to the carboxylic group and to the deprotonated carboxylate groups . In the case of the O1s core level of sample A1 [Figure (b)], three components were required to reproduce the spectrum with positions at 532.9, 531.5, and 529.8 eV.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…When the hydrogel was contacted with the copper ions solution (sample A1‐Cu), the carbon spectrum was fitted with three curve components [Figure (a)], similar to the sample before copper adsorption, but in this case the intensity at 288.0 eV increased indicating a higher content of carbonyl carbon. This carbonyl observed by XPS corresponds to the carboxylic group and to the deprotonated carboxylate groups . In the case of the O1s core level of sample A1 [Figure (b)], three components were required to reproduce the spectrum with positions at 532.9, 531.5, and 529.8 eV.…”
Section: Resultsmentioning
confidence: 99%
“…The second signal is associated to carbonyl oxygen in carboxylic acids and amides . The signal at 529.8 eV can be assigned to the amide oxygen, while the spectrum with BE of 531.5 eV would correspond to carbonyl oxygen of the protonated carboxylic groups and the ionized carboxylate form . Furthermore, the analysis of the O 1s spectra of sample A1, shows that the signal intensity at 529.8 eV of carbonyls increased, and achieved an area close to that of the OH (532.9 eV) when this sample was treated with the copper sulfate solution [Figure (b)].…”
Section: Resultsmentioning
confidence: 99%
“…If z ij distributes randomly around the surface height at 0 nm, the peak has a Gaussian shape with the standard deviation R ms . Thus, W is represented by 2.36 R ms and most (> 95%) areas of the peak are in the 2W region between ± W [57][58][59][60].…”
Section: Surface Characterization Of Al Filmsmentioning
confidence: 99%
“…The reflection properties of thin Al films due to the SPR phenomenon were also observed with a commercial SPR sensor system. The surface morphology of the Al films was observed by atomic force microscopy (AFM) [57][58][59][60]. X-ray photoelectron spectroscopy (XPS) [61,62] of the surfaces of Al films deposited on glass substrates led to the identification of oxide layers on these Al surfaces and identification of their chemical states.…”
Section: Introductionmentioning
confidence: 99%
“…The Ag films have the typical surface features in the first zone of structure zone models and the surface morphology is caused by the self-shadowing effect during the deposition at room temperature. [51][52][53][54] Silver films deposited on glass were characterized by XPS in order to obtain information on the surface state and the oxide layer. The peaks of O 1s were observed in the XPS spectra of the Ag films.…”
Section: -54mentioning
confidence: 99%