“…24 However, the same study shows that this thin oxide film does not obscure the effects of emersing the electrode at more noble potentials, i.e., electrodes subjected to various electrochemical experiments and emersed at more noble potentials show different Auger spectra and depth profiles. 24 Other reports in the litera-Langmuir 1997, 13, 3219-3225 S0743-7463(96)00897-9 CCC: $14.00 © 1997 American Chemical Society ture where UHV techniques like X-ray photoelectron spectroscopy (XPS) [26][27][28] and secondary ion mass spectrometry (SIMS) 14,15,29,30 were utilized involved exposure to air during transfer from the electrochemical cell and/or considerable time lapse between insertion of the sample into the UHV chamber and surface analysis.…”