Adsorption-resistant properties of copper phthalocyanine dispersed in a polymer matrix

Pochtennyi, A. E.; Misevich, A. V.; Sagaidak, D. I.; Fedoruk, G. G.

doi:10.1134/1.1130387

Cited by 5 publications

(6 citation statements)

References 6 publications

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“…Metal and/or dye nanoclusters in a polymer matrix exhibited a variety of nonlinear optical and electrical properties. [209][210][211][212][213] Such films are intensively studied Composite CuPc + PS films had a stronger sensing of, and a shorter recovery time for, NO 2 gas. [214][215][216] The kinetics of the composite film's response to NO 2 gas is shown in Figure 76.…”

Section: Films In Optics and Electronicsmentioning

confidence: 99%

“…Poctennyi and Misevich produced composite films by laser beam evaporation of mixtures of CuPc and PS powders. − Film thicknesses ranged from 100 to 1000 nm. The IR spectra of deposited PS films agree well with those of the original polymer.…”

Section: 3 Composite Film Deposition and Characteristicsmentioning

confidence: 99%

“…These films functioned as irradiance-dependent lenses, producing both focusing and defocusing in the far field. Metal and/or dye nanoclusters in a polymer matrix exhibited a variety of nonlinear optical and electrical properties. − Such films are intensively studied worldwide. Composite CuPc + PS films had a stronger sensing of, and a shorter recovery time for, NO 2 gas. − The kinetics of the composite film's response to NO 2 gas is shown in Figure .…”

Section: 4 Films In Optics and Electronicsmentioning

confidence: 99%

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Thin-Film Deposition of Polymers by Vacuum Degradation

Gritsenko

Krasovsky

2003

Chem. Rev.

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Section: Films In Optics and Electronicsmentioning

confidence: 99%

Section: 3 Composite Film Deposition and Characteristicsmentioning

confidence: 99%

Section: 4 Films In Optics and Electronicsmentioning

confidence: 99%

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Thin-Film Deposition of Polymers by Vacuum Degradation

Gritsenko

Krasovsky

2003

Chem. Rev.

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“…Finally, such information can be useful for understanding photosynthetic processes, photodynamic therapy of malignant processes, and so forth. This research also makes a great contribution to the practical application of porphyrin derivatives as optical devices and other components of thin-film technologies. − …”

Section: Introductionmentioning

confidence: 98%

Influence of meso-Substituted Tetraphenylporphyrin Derivatives Structure on Their Supramolecular Organization in Floating Layers and Langmuir–Blodgett Films

et al. 2012

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To study the influence of structure peculiarities of porphyrin derivatives on their supramolecular organization in thin films, 15 new meso-substituted tetraphenylporphyrin derivatives and their metal complexes with substituents (-OC(4)H(9) or -OC(16)H(33)) in para or ortho positions were studied. The films of the studied compounds were obtained by the Langmuir-Schaefer method. The behavior of porphyrin derivatives at the water-air interface was analyzed, and the conformity of the influence of molecular structure on supramolecular organization in floating layers and Langmuir-Blodgett films was defined. The absorption of these films over a wide spectral range was analyzed. The supramolecular organization of meso-substituted tetraphenylporphyrin derivatives was modeled and specified with the help of X-ray diffraction analysis. It was determined that the formation of monomolecular layers is typical for the compounds with short lateral substituents or without substituents. Tetraphenylporphyrins with extensive substituents can form a monolayer only when zinc is included in the molecular structure.

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“…Film microstructures were studied with the aid of several methods in [22,23]. External action was used in [24][25][26] to modify the structure of the sample.…”

Section: Resultsmentioning

confidence: 99%

AFM and XPA data on structural features and properties of films and powders based on naphthalocyanines

et al. 2015

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The template synthesis is used to produce powders and films based on naphthalocyanines and the corresponding metal complexes (Pc, CuPc, and NiPc). The atomic force microscopy (AFM) and X ray phase analysis (XPA) are employed in the study of structure and phase of fine powders and nanostructured films. The AFM data are used to determine the orientation and density of primary particles packed in the film. The XPA method is used to study the chemical composition and crystal structure of the synthesized samples. The regularities related to the structural features that affect the electrophysical properties of the films under study are revealed.

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Adsorption-resistant properties of copper phthalocyanine dispersed in a polymer matrix

Cited by 5 publications

References 6 publications

Thin-Film Deposition of Polymers by Vacuum Degradation

Thin-Film Deposition of Polymers by Vacuum Degradation

Influence of meso-Substituted Tetraphenylporphyrin Derivatives Structure on Their Supramolecular Organization in Floating Layers and Langmuir–Blodgett Films

AFM and XPA data on structural features and properties of films and powders based on naphthalocyanines

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