1995
DOI: 10.1109/20.490176
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Advanced metal evaporated tape

Abstract: This paper describes magnetic properties, recording characteristics and noise properties of metal evaporated (ME) tapes, especially for multilayer structures. Also the future potential of recording characteristics of ME tape is studied by a simulation method.

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Cited by 33 publications
(31 citation statements)
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“…This is evident with Auger electron spectroscopy (see Fig. 2 The presence of this layer was very important for the durability properties of the media prior to the introduction of diamond-like carbon (DLC) overcoat (Kawana et al, 1995). It was found that the thickness of the oxidized top layer was proportional to the total magnetic layer thickness.…”
Section: Microstructures Of the Obliquely Evaporated Mediamentioning
confidence: 80%
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“…This is evident with Auger electron spectroscopy (see Fig. 2 The presence of this layer was very important for the durability properties of the media prior to the introduction of diamond-like carbon (DLC) overcoat (Kawana et al, 1995). It was found that the thickness of the oxidized top layer was proportional to the total magnetic layer thickness.…”
Section: Microstructures Of the Obliquely Evaporated Mediamentioning
confidence: 80%
“…With multilayer technology, the thickness of the surface oxidation can be reduced. Kawana et al compared the properties of 200-nm-thick Co-CoO films prepared as a single-layer, two-layers, and four-layer structures (Kawana et al, 1995). Figure 2.7 shows the Auger electron spectroscopy profile for the multilayer metal evaporated media (Kawana et al, 1995).…”
Section: Microstructures Of the Obliquely Evaporated Mediamentioning
confidence: 98%
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“…This pattern can then be read back on a subsequent pass, and the stored data can be retrieved (Bhushan 1996(Bhushan , 2000. Many advances have been made in the past decades to improve magnetic recording technology and more challenges must be overcome in order to proceed with the development of higher data density magnetic data tape storage devices (Kawana et al 1995;Bhushan and Patton 1998;Luitjens and Rijckaert 1999). One of these challenges involves the relative motion between the read/write head and the data tracks on the tape, known as lateral tape motion (LTM).…”
Section: Introductionmentioning
confidence: 99%