Advanced modeling of faults in Reversible circuits

Abstract

This survey provides an overview of some recent developments in the testing and design validation of reversible logic circuits Reversible circuits are of interest in ultra-lowpower design and in quantum information processing. We describe the fault and error models that have been proposed for these circuits and summarize their properties. We also discuss algorithms for automatic test pattern generation, design-fortestability techniques, and design debugging. We conclude by briefly examining the relationship between classical reversible circuits and quantum circuits.I.

Online Missing/Repeated Gate Faults Detection in Reversible Circuits

“…In other words, we can consider the missing as buffering the inputs on the outputs. On the other hand, a repeated gate fault leads to replacing a gate with two consecutive gates of the same type, but the order of connection is same for both gates [19]. …”

“…However, it is shown that this model is not well suited for reversible circuits. Fault models for reversible circuits have been reviewed in [19]. New logical fault models based on the concepts of missing and repeated logic gate at logical level have been introduced in [11], [12].…”

“…PMGF assumes a subset of control inputs of a gate is removed [11], [12]. In other words, if a gate has k control inputs, removing m of these k control inputs results in PMGF (called m-order PMGF) [19].…”

“…This is due to the fact that the stuck-at fault model assumes a permanent connection between a wire and the voltage source. However, in quantum circuits (as a realization of reversible circuits) there is no physical wire [19].…”

A new online testing technique for reversible circuits

“…Several researchers [9][10][11][12] have studied the problem of fault modelling and testing of reversible logic circuits. While the stuck-at fault model is widely used for conventional logic circuits, newer models such as single missing-gate fault (SMGF), repeated-gate fault (RGF), partial missing-gate fault (PMGF), or multiple missing-gate fault (MMGF), have been found to be more suitable for representing physical failures or defects in reversible circuits implemented with quantum technologies [9,11,12]. We follow the fault models as described in the literature as fruitful to capture physical defects in quantum reversible circuits [4,9,11,13].…”