2017
DOI: 10.1088/1748-0221/12/02/c02017
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Advanced power analysis methodology targeted to the optimization of a digital pixel readout chip design and its critical serial powering system

Abstract: A: A dedicated power analysis methodology, based on modern digital design tools and integrated with the VEPIX53 simulation framework developed within RD53 collaboration, is being used to guide vital choices for the design and optimization of the next generation ATLAS and CMS pixel chips and their critical serial powering circuit (shunt-LDO). Power consumption is studied at different stages of the design flow under different operating conditions. Significant effort is put into extensive investigations of dynami… Show more

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Cited by 8 publications
(3 citation statements)
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“…The implementation is based on Shunt-LDO regulators integrated on the bottom of the chip. Two independent Shunt-LDO regulators [6], powered in parallel, provide independently the analog and digital supply voltages to the chip core with configurable input impedance (slope) and offset for optimal power dissipation and current sharing, as shown in Fig. 8 (left).…”
Section: Serial Poweringmentioning
confidence: 99%
“…The implementation is based on Shunt-LDO regulators integrated on the bottom of the chip. Two independent Shunt-LDO regulators [6], powered in parallel, provide independently the analog and digital supply voltages to the chip core with configurable input impedance (slope) and offset for optimal power dissipation and current sharing, as shown in Fig. 8 (left).…”
Section: Serial Poweringmentioning
confidence: 99%
“…System simulations presented in [4] studied the SLDO performance in a serial power topology including the SLDO detailed design, decoupling capacitors, parasitics and dynamic power profiles of the chip's activity. These studies showed that thanks to the presence of multiple decoupling stages (off-chip decoupling capacitors, local decoupling of ∼300 nF for the digital and ∼70 nF for the analog part) and the isolation of the power domains, most of the fast current variations would be absorbed and the noise coupling between the two power domains would be within acceptable levels 1 .…”
Section: An Improved Shunt-ldo Regulatormentioning
confidence: 99%
“…This paper presents three ways we have profited from the environment for different purposes: evaluating the performance of digital architectures, addressing their optimization for the implementation on the RD53A chip and performing extensive functional verification. It should be mentioned that the environment was also used for performing power profiling in order to verify serial powering operation [6]. This paper is organized as follows: section 2 describes the VEPIX53 simulation environment and its most relevant verification components.…”
Section: Introductionmentioning
confidence: 99%