“…In recent years, electron backscatter diffraction (EBSD) has been used to analyze the cells, sub-grains 11,12 , and other dislocation microstructures 13,14 . In particular, the Kernel average misorientation (KAM) 15 , grain reference orientation deviation (GROD) 16,17 , and grain orientation spread (GOS) 18 are obtained from the grain orientation via EBSD measurements, which can be used to qualitatively evaluate the degree of plastic deformation within the grains 19 . KAM focuses on the local misorientation gradients, while the geometrically necessary dislocation (GND) can obtain from the KAM value 3,8,15,20 .…”