2016
DOI: 10.1063/1.4941754
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Advances in x-ray framing cameras at the National Ignition Facility to improve quantitative precision in x-ray imaging

Abstract: We describe an experimental method to measure the gate profile of an x-ray framing camera and to determine several important functional parameters: relative gain (between strips), relative gain droop (within each strip), gate propagation velocity, gate width, and actual inter-strip timing. Several of these parameters cannot be measured accurately by any other technique. This method is then used to document cross talk-induced gain variations and artifacts created by radiation that arrives before the framing cam… Show more

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Cited by 61 publications
(6 citation statements)
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“…Regardless of these potential improvements, the level of resolution obtained here is already comparable to the resolution of other x-ray imaging diagnostics fielded at high-repetition-rate facilities, such as gated x-ray framing cameras [40], point-source radiography [41], and pinhole imagers [42]. However, because this diagnostic relies on phase-contrast techniques rather than absorption, it is able to observe regimes that would generally be undetectable to standard diagnostics without the large distances required for other phase-contrast diagnostics [6].…”
Section: Use For High-repetition-rate Facilities a Resolution Of Recmentioning
confidence: 68%
“…Regardless of these potential improvements, the level of resolution obtained here is already comparable to the resolution of other x-ray imaging diagnostics fielded at high-repetition-rate facilities, such as gated x-ray framing cameras [40], point-source radiography [41], and pinhole imagers [42]. However, because this diagnostic relies on phase-contrast techniques rather than absorption, it is able to observe regimes that would generally be undetectable to standard diagnostics without the large distances required for other phase-contrast diagnostics [6].…”
Section: Use For High-repetition-rate Facilities a Resolution Of Recmentioning
confidence: 68%
“…The gain uniformity is also one of the most important parameters. It could be used to get better quantitative precision for the x-ray image in the ICF experiment [24], [25]. The gain uniformity of the detector is tested, and the results show that the gain is dropped 1.7× along the pulse transmitting direction.…”
Section: Discussionmentioning
confidence: 99%
“…The gain index of the MCP depends on the operating voltage. A slightly change in the gate pulse voltage on the microstrip line will cause a great gain change in the MCP [17,18].…”
Section: Jinst 16 P06007mentioning
confidence: 99%