2021
DOI: 10.1016/j.coal.2021.103852
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Advancing the application of atomic force microscopy (AFM) to the characterization and quantification of geological material properties

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Cited by 38 publications
(8 citation statements)
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“…Imaging techniques can describe quantitative information about pore space, such as X-ray computed tomography (X-CT), , which can quantify porosity and the pore size distribution, but X-CT can only scan small core samples. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) can reveal the microscopic morphological characteristics of rocks, including the distribution of pores, mineral content, and surface morphology of rocks. Focused ion beam scanning electron microscopy (FIB-SEM) enables the imaging and quantification of mineral and organic matter content, pore morphology, and topological features.…”
Section: Pore Scale Characteristics During Mineralization Storagementioning
confidence: 99%
“…Imaging techniques can describe quantitative information about pore space, such as X-ray computed tomography (X-CT), , which can quantify porosity and the pore size distribution, but X-CT can only scan small core samples. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) can reveal the microscopic morphological characteristics of rocks, including the distribution of pores, mineral content, and surface morphology of rocks. Focused ion beam scanning electron microscopy (FIB-SEM) enables the imaging and quantification of mineral and organic matter content, pore morphology, and topological features.…”
Section: Pore Scale Characteristics During Mineralization Storagementioning
confidence: 99%
“…Furthermore, the 2D and 3D AFM figures show that the rock surface roughness seems to be higher at the same position after being treated by the electric field. Here, root mean square roughness ( R q ) and average roughness ( R a ) were employed to quantitively analyze the surface roughness of the rock. , Various area dimensions were chosen to further ascertain the reliability of the surface roughness of the sample (Supporting Information). The surface roughness of the sample before and after electric field exposure is shown in Figure .…”
Section: Resultsmentioning
confidence: 99%
“…Proposed in [201], the tapping-mode AFM (cf. Figure 10(a)) gauges the tip-sample interaction force by optical sensors (or strain gauges) with reduced lateral force and therefore less tip/sample degradation, making itself a useful tool not only in biomaterial and soft medium engineering [202] but also in quantification of hard geological material properties [203,204].…”
Section: Tapping-mode Atomic Force Microscope (Afm)mentioning
confidence: 99%