Advantages of Total Reflection X‐Ray Fluorescence Analysis Over Conventional Trace Analytical Techniques in Different Areas of Material Characterization
Nand L. Mishra
Abstract:Total reflection X‐ray fluorescence (TXRF) spectrometry, a variant of energy‐dispersive X‐ray fluorescence (EDXRF), has its detection limits comparable with conventional trace elemental determination techniques, e.g. inductively coupled plasma mass spectrometry (ICP‐MS) and inductively coupled plasma – atomic emission spectrometry (ICP‐AES). In addition, it has several advantages over these techniques, e.g. requirement of only a few microliters of sample (or picogram level of analytes), possibility of determin… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.