Aerosol damage to a microchannel plate analysed by X‐ray photoelectron spectromicroscopy

Walton, John

doi:10.1002/sia.2510

Cited by 5 publications

(7 citation statements)

References 13 publications

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“…The application of multivariate analysis on these large XPS data sets provides a method for the extraction of spectral and image information not apparently obvious . Over the years, principal component analysis (PCA) methods have become more efficient at removing artifacts and noise from XPS image data sets by sorting and reducing the number of factors to compute using singular value decomposition and nonlinear iterative partial least squares routines . XPS imaging has been successfully applied to a wide variety of applications from adhesion issues of polymethyl methacrylate, 3D imaging of nanocomposites, evaluation of wear scars and the differentiation of similar carbon chemical states …”

Section: Introductionmentioning

confidence: 99%

Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution

Kobe

Badley

Henderson

et al. 2017

Surface & Interface Analysis

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This paper explores quantitative X-ray photoelectron spectroscopy imaging on three different Ni-Cr-Mo Hastelloy® alloys (BC-1, C-22 and G-30) with differing Cr and Mo contents. The alloys were subjected to a simulated critical crevice corrosion solution. Ni-based alloys have been shown to exhibit excellent resistance to a range of corrosive media due to the formation of an inert oxide layer, primarily containing Cr and Mo. However, these alloys may rapidly corrode in the crevice environment produced by seams, gaskets or deposits of debris on the alloy surface. Understanding how the oxide film is influenced by the Cr and Mo content is crucial in determining an optimal alloy composition that reduces or suppresses the possibility of crevice corrosion. The protective oxide films are very thin in nature, generally several nanometers. XPS imaging was used to monitor changes in oxide film composition and to correlate the distribution of Cr and Mo to the grain structure of the alloys. Figure 7. Overlaid XPS images of Mo metal (red), Mo IV (blue) and Mo VI (green) for sample G-30 superimposed with the electron backscatter diffraction image showing the Σ3 and random grain boundaries. B. Kobe et al. wileyonlinelibrary.com/journal/sia

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Section: Introductionmentioning

confidence: 99%

Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution

Kobe

Badley

Henderson

et al. 2017

Surface & Interface Analysis

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“…One of the greatest issues industry faces is the failure of manufactured parts, which is typically caused by oxidation or corrosion [28,42]. Imaging XPS has been successfully applied to many systems, including adhesive joint failure [43], pitting corrosion in Inconel [26], Ni-Cr-Mo alloys [44] and the analysis of contaminated channelplates [45]. In some cases, the thickness of oxide islands has been observed [7,29].…”

Section: Failure Analysis and Corrosionmentioning

confidence: 99%

Imaging XPS for industrial applications

Morgan

2019

Journal of Electron Spectroscopy and Related Phenomena

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Imaging XPS has been available on commercial XPS instruments since the 1990's, however its exploitation in the elucidation of surface chemistry has been minimal due to historical limitations in spatial resolution and acquisition times. Major developments in both instrumentation and multivariate data analysis techniques have improved greatly on all these aspects and herein a range of imaging analysis to illustrate the power of XPS imaging to a diverse range of industrial sectors is presented.

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“…[4] More recently, non-linear iterative partial least squares (NIPALS) has been used to sequentially calculate the principal components, leading to a significant reduction in processing time, because in XPS analysis, there are many fewer chemically significant components than there are elements in the data set. [5] In this paper, we introduce an iterative SVD procedure to compute a limited number of components, which utilises parallel computation, to further reduce processing time. SVD is mathematically equivalent to PCA.…”

Section: Introductionmentioning

confidence: 99%

Developments in numerical treatments for large data sets of XPS images

Béchu

Richard‐Plouet

Fernandez

et al. 2016

Surface & Interface Analysis

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Empirical data include signal with superimposed variations in intensity of an unwanted nature. These signal fluctuations are of particular interest in XPS measurements when the data are partitioned into both spatial and energy collection bins. In separating signals into a data cube with axes of energy and displacement in x and y, this division creates many more data binning locations than is typical of spectroscopy or classical imaging-type measurements resulting in only small numbers of counts per data bin. Under these circumstances, errors can easily dominate the signal of interest. It is usually assumed that pulse counted data have Poissonian statistics, so that the magnitude of the noise is proportional to the square root of the number of counts. When data are distributed throughout a 3D cube, the counts per voxel are typically low and any random errors can cause deviation from the expected Poisson distributed intensities, which has consequences for data treatment. This paper shows how raw intensities from 3D data sets can be preprocessed to recover a pseudo-Poisson behaviour, which allows principal component analysis with prior data scaling to be used to process the data. Data acquired from crystal formations on photosensitive films based on titanium clusters are used to demonstrate these techniques.

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Aerosol damage to a microchannel plate analysed by X‐ray photoelectron spectromicroscopy

Cited by 5 publications

References 13 publications

Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution

Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution

Imaging XPS for industrial applications

Developments in numerical treatments for large data sets of XPS images

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