1986
DOI: 10.1002/crat.2170210520
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AES Depth Profiling of Nitrogen Implanted Fe(001)

Abstract: Auger electron spectroscopy (AES) combined with a well controlled ion mill is applied for the study of nitrogen implanted (N$ ions, 120 keV) into iron single crystals in doses ranging from 8 x 10" to 5 x 1017N-atoms/cm2, also with subsequent heat treatment. The nitrogen depth profiles are Gaussian-like in shape for doses up to 1.5 x 1017 Natoms/cm2. At higher doses deviations are observed.The nitride bonding state was indicated but a part of the implanted nitrogen appears to be weakly bonded.Spektroskopie der … Show more

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