2005
DOI: 10.5254/1.3547869
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AFM Study of Rubber Compounds

Abstract: A series of rubber compounds filled with carbon blacks and silica has been studied by atomic force microscopy (AFM). The microdispersion of carbon black aggregates in rubber compounds can be clearly observed. The surface morphology of worn treads after road testing studied by AFM is also reported.

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Cited by 19 publications
(7 citation statements)
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“…It is known that the phase-contrast optical microscope is a suitable means to distinguish rubber phases in NR/SBR blends, due to different refractive indices of NR and SBR. 3943 In addition, AFM has been used for morphological study of rubber blends such as SBR/BR, 4446 IIR/BR, 47 NR/BR, 45 IIR/NR, 48 and NR/SBR. 45,49 Although the phase identification of rubber blends by AFM is not clear in some cases, AFM is known to be easier than transmission electron microscopy for the morphology analysis of rubber blends due to relatively simple preparation of the specimen.…”
Section: Introductionmentioning
confidence: 99%
“…It is known that the phase-contrast optical microscope is a suitable means to distinguish rubber phases in NR/SBR blends, due to different refractive indices of NR and SBR. 3943 In addition, AFM has been used for morphological study of rubber blends such as SBR/BR, 4446 IIR/BR, 47 NR/BR, 45 IIR/NR, 48 and NR/SBR. 45,49 Although the phase identification of rubber blends by AFM is not clear in some cases, AFM is known to be easier than transmission electron microscopy for the morphology analysis of rubber blends due to relatively simple preparation of the specimen.…”
Section: Introductionmentioning
confidence: 99%
“…AFM has been extensively used to investigate dispersion of fillers in polymer matrices. Filler dispersion can be understood in terms of height distribution, 3D images and average surface roughness of the scanned samples 35,36 . In the present work, dispersion of untreated silica, silica treated with TESPT and silica treated with DMAc/LiCl have been investigated using AFM in tapping mode and the results are presented in Figures 6, 7 and Table 3.…”
Section: Resultsmentioning
confidence: 99%
“…Filler dispersion can be understood in terms of height distribution, 3D images and average surface roughness of the scanned samples. 35,36 In the present work, dispersion of untreated silica, silica treated with TESPT and silica treated with DMAc/LiCl have been investigated using AFM in tapping mode and the results are presented in Figures 6, 7 and Table 3. For high and medium NBR compositions filled with untreated silica, maximum scanned heights of 287 and 390 nm are observed with the corresponding average roughness values, Ra, of 32 and 70 nm, respectively and resulting in poor dispersion as shown in Micrographs 6a and 7a.…”
Section: Atomic Force Microscopic Studies On the Dispersion Of Silimentioning
confidence: 99%
“…NUC3 yielded a high tan δ, indicating high antiwet‐skid property and rolling resistance. Topological atomic force microscopy (AFM) images of NUC1‐3 obtained by cyrocutting with a microtomb are shown in Figure 1, which provide topological microphases such as filler dispersion on rubber matrix and rubber surface morphology 21. As for the AFM image of NUC1, a homogenous and smooth surface was observed, and carbon black was well dispersed in rubber matrix.…”
Section: Resultsmentioning
confidence: 99%