Ag2Te thin films' structural and optical characteristics as a result of Al doping

Abstract

During the course of this investigation, Ag2Te and Al-doped Ag2Te films' structural and optical properties at various concentrations (1%, 1.5%) are examined. The thermal evaporation method was used to deposit 400-nm thick Ag2Te thin films on glass substrates at 100 °C. The structure is monoclinic of the polycrystalline films were revealed by (XRD). Between 1 and 1.5%, the activated precursor did not vary with respect to the favored direction. According to the XRD results, the mean crystal sizes ranged from 25.62 to 37.13 nm. The surface of the film is incredibly smooth, according to atomic force microscope study (AFM). The produced films' optical characteristics were investigated. optical absorption coefficient (α) of films were determined using the absorption spectra within the wavelength region (400-1000) nm. It was discovered that the optical energy gap allows direct transmission and that it narrows with doping.. AFM was used to measure the grain size and roughness, which change when impurities are added.