ALFA: A program for accurate analysis of complex alpha-particle spectra on a PC

Babeliowsky, T.; Bortels, G.

doi:10.1016/0969-8043(93)90085-o

Cited by 22 publications

(6 citation statements)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…where, A is the peak area, u is the distance to the peak position μ, σ is the standard deviation of the Gaussian and τ is the tailing parameter. This model was improved by subtraction of the long tail distribution and a mix of two exponential functions with different lengths, τ 1 < τ 2 , and a normalized weighting factor η [33]. In the present case of monolayer alpha recoil sources, the peaks are expected to be very narrow and the long tail distribution is expected to be non-existent, in which case it can be neglected.…”

Section: Peak Fit Model and Aasifitmentioning

confidence: 99%

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production

et al. 2020

View full text Add to dashboard Cite

Four different techniques were applied for the production of 233U alpha recoil ion sources, providing 229Th ions. They were compared with respect to a minimum energy spread of the 229Th recoil ions, using the emitted alpha particles as an indicator. The techniques of Molecular Plating, Drop-on-Demand inkjet printing, chelation from dilute nitric acid solution on chemically functionalized silicon surfaces, and self-adsorption on passivated titanium surfaces were used. All fabricated sources were characterized by using alpha spectrometry, radiographic imaging, and scanning electron microscopy. A direct validation for the estimated recoil ion rate was obtained by collecting 228Th recoil ions from 232U recoil ion sources prepared by self-adsorption and Molecular Plating. The chelation and the self-adsorption based approaches appear most promising for the preparation of recoil ion sources delivering monochromatic recoil ions.

show abstract

Section: Peak Fit Model and Aasifitmentioning

confidence: 99%

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production

et al. 2020

View full text Add to dashboard Cite

show abstract

“…They obtained a better fit after pre-treating the spectrum by subtracting a long tail distribution and then fitting a mix of two exponential functions with different characteristic lengths, τ 1 and τ 2 , using normalised weighting factors η 1 and 1 À η 1 . This was implemented in the software package ALFA (Babeliowsky and Bortels, 1993). Pommé and Sibbens (2008) abolished the pretreatment of the spectrum and added the third exponential function into the fit function with a normalised weighting factor…”

Section: Introductionmentioning

confidence: 99%

Improved peak shape fitting in alpha spectra

Pommé

Marroyo²

2015

Applied Radiation and Isotopes

View full text Add to dashboard Cite

Peak overlap is a recurrent issue in alpha-particle spectrometry, not only in routine analyses but also in the high-resolution spectra from which reference values for alpha emission probabilities are derived. In this work, improved peak shape formulae are presented for the deconvolution of alpha-particle spectra. They have been implemented as fit functions in a spreadsheet application and optimum fit parameters were searched with built-in optimisation routines. Deconvolution results are shown for a few challenging spectra with high statistical precision. The algorithm outperforms the best available routines for high-resolution spectrometry, which may facilitate a more reliable determination of alpha emission probabilities in the future. It is also applicable to alpha spectra with inferior energy resolution.

show abstract

“…According to the technical principle, and they can be divided into two main types: gate ionization chamber detectors and ion-injected silicon detectors, among which ion-injected silicon detectors have better resolution and are more widely used [ 33 , 34 ]. The current research on α spectrometers is more focused on the study of characteristic peak resolution methods [ 33 , 35 , 36 , 37 , 38 , 39 , 40 , 41 , 42 ].…”

Section: Application Of α-Particle Detection Technologymentioning

confidence: 99%

Application and Development of Noncontact Detection Method of α-Particles Based on Radioluminescence

Cheng

Xu³

et al. 2021

Sensors

View full text Add to dashboard Cite

The detection of α particles is of great significance in military and civil nuclear facility management. At present, the contact method is mainly used to detect α particles, but its shortcomings limit the broad application of this method. In recent years, preliminary research on noncontact α-particle detection methods has been carried out. In this paper, the theory of noncontact α-particles detection methods is introduced and studied. We also review the direct detection and imaging methods of α particles based on the different wavelengths of fluorescence photons, and analyze the application and development of this method, providing an important reference for researchers to carry out related work.

show abstract

ALFA: A program for accurate analysis of complex alpha-particle spectra on a PC

Cited by 22 publications

References 3 publications

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production

Improved peak shape fitting in alpha spectra

Application and Development of Noncontact Detection Method of α-Particles Based on Radioluminescence

Contact Info

Product

Resources

About

ALFA: A program for accurate analysis of complex alpha-particle spectra on a PC

Cited by 22 publications

References 3 publications

Alpha spectrometric characterization of thin 233U sources for 229(m)Th production

Alpha spectrometric characterization of thin 233U sources for 229(m)Th production

Improved peak shape fitting in alpha spectra

Application and Development of Noncontact Detection Method of α-Particles Based on Radioluminescence

Contact Info

Product

Resources

About

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production

Alpha spectrometric characterization of thin ²³³U sources for ^229(m)Th production