2021
DOI: 10.48550/arxiv.2104.08228
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Algorithm-driven Advances for Scientific CT Instruments: From Model-based to Deep Learning-based Approaches

S. V. Venkatakrishnan,
K. Aditya Mohan,
Amir Koushyar Ziabari
et al.
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Cited by 1 publication
(2 citation statements)
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“…Many machine learning (ML) techniques have been successfully used and integrated to light source and electron microscopy data analysis workflows to enhance and improve the quality of images and reconstructions [9,36,56], including image denoising [62,39], artifact reduction [65] and feature extraction [51]. These techniques can also be used for accelerating the performance of workflows and data acquisition [38].…”
Section: Related Workmentioning
confidence: 99%
See 1 more Smart Citation
“…Many machine learning (ML) techniques have been successfully used and integrated to light source and electron microscopy data analysis workflows to enhance and improve the quality of images and reconstructions [9,36,56], including image denoising [62,39], artifact reduction [65] and feature extraction [51]. These techniques can also be used for accelerating the performance of workflows and data acquisition [38].…”
Section: Related Workmentioning
confidence: 99%
“…The ptychographic reconstruction process is typically data-intensive, requiring hundreds of iterations over diffraction patterns and the reconstructed object. Moreover, if the goal is to recover a 3D volumetric image, then tomographic (or laminographic) reconstruction techniques need to be performed after ptychographic reconstruction [30,56], further increasing the computational demand and execution time of the processing pipeline [10,43].…”
Section: Introductionmentioning
confidence: 99%