Algorithm for characterizing the subcellular structures of nanometer-sized biological specimens in a solution using x-ray free-electron lasers

Yang, Jing; Chen, Ning-Jung; Hwu, Y.; Chen, Chien-Chun

doi:10.1103/physrevmaterials.3.123803

Cited by 1 publication

(2 citation statements)

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“…The final reconstructions from totally and partially coherent experiments were generated by averaging the best 20 out of 100 reconstructed images in the GHIO process [16]. The density distributions of two reconstructed images show an excellent agreement with the design.…”

Section: (A) and (B)mentioning

confidence: 99%

“…In order to obtain a sufficient signal-to-noise ratio at the high-frequency region (i.e., the high-q region), implanting high-Z materials, such as gold nanoparticles, into the specimen to enhance the diffraction intensities is a potential approach. Although experiments have demonstrated that the recognizable diffraction intensities can be extended to the higher-frequency region, the introduced Poisson noise might still be stronger than the signal from specimens [14], [15], [16]. The other direction is to produce brighter sources, such as X-ray free-electron lasers (XFEL), because the scattering signal is proportional to the fourth power of the flux of incidence [17], [18], [19], [20].…”

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confidence: 99%

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Ensemble Diffraction Microscopy: An Imaging Technique That Allows High-Resolution Diffraction Imaging Using Both Totally and Partially Coherent Sources

et al. 2023

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Coherent diffraction microscopy (CDM) is a potential approach to image micromaterials at atomic resolution without crystals. Due to the lack of high-angle scattering, the achieved resolution is limited to several nanometers. Small-angle scattering allows researchers to reveal high-resolution 3D structures of specimens by fitting 1D diffraction signals. However, prerequisite 3D models and non-unique solutions restrict the potential to image general specimens. Under the assumption of an ensemble containing large amounts of identical specimens with the same orientation, the intensity distribution of the diffraction pattern of the whole ensemble is approximated to the form factor of a single specimen multiplied by the number of identical specimens. Since the diffraction intensities are contributed from the whole ensemble, the signal can be significantly extended to high-frequency regions. The feasibility of ensemble diffraction microscopy (EDM) was demonstrated by a designed sample using both totally and partially coherent X-ray sources at Taiwan Photon Source (TPS). The reconstructed images show excellent consistency with the image of a scanning electron microscope. This work represents a new protocol for directly characterizing the structures of nanomaterials, or potentially biomacromolecules, from accumulated X-ray scattering data.

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Section: (A) and (B)mentioning

confidence: 99%