Abstract:We present a silicon-chip-based optical performance monitor, using an all-optical RF spectral analysis technique, capable of real-time performance monitoring both phase and intensity encoded signals. The device operates unimpeded by the effects of photo-generated free-carriers.
©2010 Optical Society of America
IntroductionOptical performance monitoring, the measurement of impairments on data signals, is crucial to the operation of reconfigurable optical networks [1,2]. In ultrahigh speed serial data communications, optical performance monitoring requires tools able to characterise short, broad-bandwidth pulses to ensure optimal performance. Traditional electronic methods, limited to bandwidths of <100GHz, are unable to achieve this. All-optical techniques, particularly those harnessing ultrafast optical nonlinearities, may solve this problem. Recent interest has piqued in providing new short pulse characterization solutions with the capacity for on-chip integration [3][4][5][6][7]. Of these new techniques, cross-phase modulation based radio-frequency spectrum analysis (XPM-RFSA) has been proved as an effective tool for chip-based optical performance monitoring [8]. Silicon is particularly interesting for integration, due to the reliability and cost-effectiveness of CMOS fabrication processes. However previous XPM-RFSA performance monitoring demonstrations have been achieved chalcogenide glasses, which unlike silicon do not suffer photo-generated free-carrier effects that are well known to complicate nonlinear interactions [9]. This raises concerns about the usefulness of silicon waveguides for XPM-RFSA.In this paper we demonstrate silicon-chip-based optical performance monitoring of both phase-and intensity-modulated signals. We use XPM-RFSA to monitor residual group velocity dispersion on differential phase-shift keyed (DPSK) and return-to-zero on-off keyed (RZ-OOK) signals at serial data rates of 640Gbit/s, using techniques that lend themselves to on chip integration. We show that despite the issue of free-carriers, we are able to accurately measure radio-frequency (RF) spectra through cross-phase modulation (XPM) in a silicon nanowire waveguide, demonstrating the first silicon-chip-based XPM-RFSA. Our results demonstrate a modulation format versatile solution to terabaud optical performance monitoring, with the potential for monolithic integration on a CMOS compatible platform. 2. Background RF spectral monitoring is commonly used to analyse the temporal characteristics of signals. The RF spectrum is the power spectrum of signal intensity, i.e. for optical signals this is the squared magnitude of the Fourier transform of time varying intensity. RF spectra are usually obtained by electronic means -after measuring timevarying intensity with a photodetector, analysis is done in the electronic domain. However, the limited bandwidth (<100GHz) of photodetectors restricts the usefulness of electronics in analysis of the ultra-short optical pulses necessary for ultrahigh-speed serial communication links.