All Tests for a Fault are Not Eyually Valuable for Defect Detection

Kapur, R.; Park, Jaehong; Mercer, M.R.

doi:10.1109/test.1992.527898

Cited by 23 publications

(5 citation statements)

References 15 publications

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“…The curve shows that as the number of observations of test site increases, the contribution to the overall defective part level decreases. This model has been verified using surrogate bridging fault simulations on both benchmark and commercial circuits [8]. Additionally, the model predictions are highly correlated with data collected from a commercial chip [4].…”

Section: Do-re-me Test Generation and The Mpg-d Defective Part Level mentioning

confidence: 82%

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Minimizing defective part level using a linear programming-based optimal test selection method

Tian

Grimaila

Shi

2003

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-0

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Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

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Section: Do-re-me Test Generation and The Mpg-d Defective Part Level mentioning

confidence: 82%

“…In equations from (4) to (7), ½ Ñ and Ú is the number of detections for fault site , that is, Ú ´Ô ¾ µ Ü (8) and…”

Section: Linear Programming For Optimal Test Pattern Selectionmentioning

confidence: 99%

Minimizing defective part level using a linear programming-based optimal test selection method

Tian

Grimaila

Shi

2003

Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-0

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“…As the quality demands increase, the effectiveness of test generation without any defect consideration becomes questionable. High quality test generation requires a better knowledge of defect behavior [1][2][3][4][5].…”

Section: Introductionmentioning

confidence: 99%

Testing for gate oxide short defects using the detectability interval paradigm

Galliere

Azaïs

Comte

et al. 2014

It - Information Technology

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This paper addresses the detection improvement of Gate Oxide Short defect using a delay test strategy. To achieve this objective, the concept of detectability interval is first introduced in the context of detection of short defects using Boolean test technique. Then this paradigm is extended to the detection of Gate Oxide Short defects using delay testing. Finally, it is shown that it is possible to significantly improve the detection of this kind of defect.

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“…For instance, [KAPU92] This work was supported in part by the Semiconductor Research Corporation under contract SRC 93- showed that for most commonly used model, the single stuck-at fault, the range in defective part levels can spread over several orders of magnitude. [PARK94] did extensive studies on this issue and demonstrated that a high fault coverage was hard to predict an equally high quality.…”

Section: Introductionmentioning

confidence: 99%

Enhanced testing performance via unbiased test sets

Wang¹,

Mercer²,

Williams³

Proceedings the European Design and Test Conference. ED&TC 1995

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The test generation task involves two separate questions which are: 1) what should the next test be?, and 2) Have enough tests been selected to achieve an acceptable defective part level? Historically, the same fault set (usually the stuck-at-fault set) has been used to answer both questions. When both questions use the same fault set, a statistical bias is introduced t o the answer of the second question. In this paper, we propose the use of independent models for answers to the two questions above, and we show, via probabilistic analysis as well as experiments, that the result is a superior test set selection method.

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All Tests for a Fault are Not Eyually Valuable for Defect Detection

Cited by 23 publications

References 15 publications

Minimizing defective part level using a linear programming-based optimal test selection method

Minimizing defective part level using a linear programming-based optimal test selection method

Testing for gate oxide short defects using the detectability interval paradigm

Enhanced testing performance via unbiased test sets

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