1997
DOI: 10.1023/a:1018517905813
|View full text |Cite
|
Sign up to set email alerts
|

Untitled

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
2
0

Year Published

2012
2012
2013
2013

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 12 publications
0
2
0
Order By: Relevance
“…Usually annealing is used for such purposes. 27,28 In our case Ni 2 Si most likely is formed due to suitable energetic conditions such as an external electric field and contact potential at the solution/PS interface. From the other hand the energy of the electrochemical system was not enough to provide to the following NiSi and NiSi 2 formation as there were no any related peaks on the XRD patterns.…”
mentioning
confidence: 77%
See 1 more Smart Citation
“…Usually annealing is used for such purposes. 27,28 In our case Ni 2 Si most likely is formed due to suitable energetic conditions such as an external electric field and contact potential at the solution/PS interface. From the other hand the energy of the electrochemical system was not enough to provide to the following NiSi and NiSi 2 formation as there were no any related peaks on the XRD patterns.…”
mentioning
confidence: 77%
“…26 In our opinion, a-Si represents a favorable material for the Ni diffusion even at room temperature as Ni ions have been found to easily diffuse into Si on its defects. 27 We suppose that an external electric field provides the concentration of Ni ions near the surface of pore's walls and their further diffusion into the skeleton of PS. However additional energy is required to provide the conversion of the PS surface enriched with Ni ions into nickel silicide.…”
mentioning
confidence: 99%