2014 International Symposium on Electromagnetic Compatibility 2014
DOI: 10.1109/emceurope.2014.6931055
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Alternative conducted emission measurements for industry

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Cited by 9 publications
(7 citation statements)
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“…Besides, in the equations, the CM and DM voltages/currents are stated with only CM and DM subscripts without "REF" in order to emphasize that these are industrial currents not the reference one of the laboratory environment. Finally, all the impedance measurements lead to correction factors between the reference emission setup with the reference LISN and the alternative setup without the reference LISN as given in equations (9) -(12) with the assumption that CM and DM interference voltage sources inside the EUT are constant [6].…”
Section: Fig 2 Circuit Models Of Alternative Conducted Emission Measmentioning
confidence: 99%
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“…Besides, in the equations, the CM and DM voltages/currents are stated with only CM and DM subscripts without "REF" in order to emphasize that these are industrial currents not the reference one of the laboratory environment. Finally, all the impedance measurements lead to correction factors between the reference emission setup with the reference LISN and the alternative setup without the reference LISN as given in equations (9) -(12) with the assumption that CM and DM interference voltage sources inside the EUT are constant [6].…”
Section: Fig 2 Circuit Models Of Alternative Conducted Emission Measmentioning
confidence: 99%
“…Finally, a good work on alternative methods is accomplished in [5] where, in addition to direct measurement methods, an indirect method based on the circuit models was introduced in time domain. In [6], we have established the fundamentals of conducted emission tests based on the impedance measurements of the EUT, supply and used mains cable by using two-probe approach. Although there are some methods for impedance measurements in the literature, we chose the two current probe method stated in [7] for our method.…”
Section: Introductionmentioning
confidence: 99%
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