2018
DOI: 10.3390/mi9110589
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Aluminum Patterned Electroplating from AlCl3–[EMIm]Cl Ionic Liquid towards Microsystems Application

Abstract: Electroplating process is being used to deposit a relatively thick film of metallic materials for various microsystems applications, such as for the wafer-level bonding sealing frame and as a thermal actuator. Recently, the Al electroplating process from ionic liquid has been an attractive deposition method for anti-corrosion coatings. To extend the utilization of the film, in particular for microsystems application, a microstructure formation by patterned electroplating of Al from AlCl3–1-ethyl-3-methylimidaz… Show more

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Cited by 21 publications
(16 citation statements)
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“…The faradaic current efficiency ( CE F ) is defined as the ratio of the experimentally obtained amount of material deposited to its theoretical calculation according to Faraday's equation. It is mathematically expressed as CEnormalF=mFzMIt, [ 41 ] where m represents the measured mass of elements deposited at the cathode, F is Faraday's constant (96 485 C mol −1 ), z is the valence of the ions, M is the molar mass of the substance, I is the applied current, and t expresses the deposition time. Accordingly, the CE F of our BF plating process corresponds to 89.4%.…”
Section: Resultsmentioning
confidence: 99%
“…The faradaic current efficiency ( CE F ) is defined as the ratio of the experimentally obtained amount of material deposited to its theoretical calculation according to Faraday's equation. It is mathematically expressed as CEnormalF=mFzMIt, [ 41 ] where m represents the measured mass of elements deposited at the cathode, F is Faraday's constant (96 485 C mol −1 ), z is the valence of the ions, M is the molar mass of the substance, I is the applied current, and t expresses the deposition time. Accordingly, the CE F of our BF plating process corresponds to 89.4%.…”
Section: Resultsmentioning
confidence: 99%
“…To use the electrodeposited aluminum as an anode material, it is desirable to have a large surface area and strong adhesion with the molybdenum substrate. Therefore, the correlation between the current density and deposition time was studied to determine the optimum conditions for aluminum electrodeposition. Figure S2 shows the current density versus electroplating time curve and the corresponding SEM images of the deposited aluminum anode at several time intervals. Over the whole plating process, a current density of approximately −2.0 to −2.5 mA cm –2 was maintained.…”
Section: Resultsmentioning
confidence: 99%
“…Al deposited under strict moisture and atmospheric exclusion are shown to have no Cl/O impurities by EDX. 24,25 The Cl and especially O impurities are likely the cause for the increase in film resistivity. Other impurities like nitrogen or sulfur present in the additives were not detected by EDX, which is in agreement with the literature.…”
Section: Optimization Ofmentioning
confidence: 99%