2002
DOI: 10.1023/a:1021956128414
|View full text |Cite
|
Sign up to set email alerts
|

Untitled

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2018
2018

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 12 publications
(1 citation statement)
references
References 2 publications
0
1
0
Order By: Relevance
“…As shown in works [11][12][13][14][15][16][17][18][19][20][21][22][23][24], surface treatment can be effectively carried out using low energy high current pulsed electron beam (LEHCPEB) [11][12][13], laser treatment [14,15] and high-power pulsed ion beam (HPPIB) [16][17][18][19][20][21][22][23][24]. To study thin modified layers of dielectrics, the method of secondary ion mass spectrometry [25][26][27] and the Rutherford backscattering method [28,29] have proved to be very useful. The above methods of radiation treatment are used to modify and create structures that can not be obtained by traditional technologies.…”
Section: Introductionmentioning
confidence: 99%
“…As shown in works [11][12][13][14][15][16][17][18][19][20][21][22][23][24], surface treatment can be effectively carried out using low energy high current pulsed electron beam (LEHCPEB) [11][12][13], laser treatment [14,15] and high-power pulsed ion beam (HPPIB) [16][17][18][19][20][21][22][23][24]. To study thin modified layers of dielectrics, the method of secondary ion mass spectrometry [25][26][27] and the Rutherford backscattering method [28,29] have proved to be very useful. The above methods of radiation treatment are used to modify and create structures that can not be obtained by traditional technologies.…”
Section: Introductionmentioning
confidence: 99%