2016
DOI: 10.1016/j.solmat.2015.11.026
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Amazing stable open-circuit voltage in perovskite solar cells using AgAl alloy electrode

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Cited by 78 publications
(74 citation statements)
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“…[ 43 ] In addition, reports suggesting interaction of the perovskite iodide with the Al metal are another degradation mechanism of perovskite-based solar cells. [ 44 ] Since a thick AZO layer is in between the perovskite/PCBM layers and the Al we suggest that the delay in degradation of the p-i-n device when AZO is used could potentially be attributed to a delay in interaction between the perovskite and the top metal. Despite that, the Al oxidation is a separate mechanism and thus the devices using AZO also degrade after 1000 h of exposure.…”
Section: Resultsmentioning
confidence: 92%
“…[ 43 ] In addition, reports suggesting interaction of the perovskite iodide with the Al metal are another degradation mechanism of perovskite-based solar cells. [ 44 ] Since a thick AZO layer is in between the perovskite/PCBM layers and the Al we suggest that the delay in degradation of the p-i-n device when AZO is used could potentially be attributed to a delay in interaction between the perovskite and the top metal. Despite that, the Al oxidation is a separate mechanism and thus the devices using AZO also degrade after 1000 h of exposure.…”
Section: Resultsmentioning
confidence: 92%
“…This was evidently due to the encapsulation failing and substantial water ingress causing complete active layer decomposition [35], [36], [37]. to be susceptible to oxygen and water-induced degradation [38], [39], so is not surprising that the failure was catastrophic at this point. It is important to note this edge sealant, which is based upon a thermosetting epoxy, has been used before in OPV and dye sensitised solar cell modules, with similar size modules and also on glass substrate and has been shown to achieve over one year of outdoor performance.…”
Section: Degradation Of Psc Modulesmentioning
confidence: 99%
“…First, the Au NPs can be etched by the halide during the processing CH 3 NH 3 PbI 3 absorber and the gold diffusion and migration into the perovskite material possibly take place in the thermal annealing treatment of the perovskite precursor films, causing detrimental and irreversible changes to the absorber. [27][28][29] Au migration into the perovskite material was found for PSC devices with metal contacts under thermal stress even at 70 °C. 28 This metal migration was observed to cause irreversible changes to the devices and in turn severely affected the device performance metrics.…”
Section: Methodsmentioning
confidence: 94%